STRUCTURAL CHARACTERISTICS OF THIN-FILM SYSTEMS OF Al and Fe_{3}O_{4}

Abstract

In this work, layered thin films of nano-sized Al and Fe₃O₄ powders were studied by X-ray diffraction method, and it was determined that Al and Fe₃O₄ substances can maintain their crystal structure in thin layers with a thickness of h = 30 and 60 nm. The main reason for this is explained by their cubic symmetry crystal structure with Fm-3m and Fd-3m space groups, respectively. In the X-ray diffraction spectra, it was determined that the maxima corresponding to Al crystals correspond to the (111) and (200) atomic planes, and the maxima corresponding to Fe₃O₄ crystals correspond to the (044) atomic plane. If we take into account that Al and Fe₃O₄ thin films taken separately were obtained in smaller
sizes: h = 15 and 30 nm thick. Nevertheless, the crystal structure is formed. It was determined that both aluminum and iron oxide layers retain their structural properties in these layers.